Defect dynamics evolution in Zn1-xAlxO nanocrystals: Interplay of structural, optical, and electrical properties

dc.contributor.affiliationPontificia Universidad Católica del Perú. Departamento de Ciencias
dc.contributor.authorAragón, F.F.H.
dc.contributor.authorMorais, P.C.
dc.contributor.authorSouza, P.E.N.
dc.contributor.authorSilva, S.W.
dc.date.accessioned2026-03-13T16:58:08Z
dc.date.issued2025
dc.description.abstractDefect engineering is essential for tuning structural, optical, and electronic properties of semiconductors. This study presents a comprehensive investigation of defect evolution in Zn₁₋ₓAlₓO nanocrystals, showing how aluminum incorporation dynamically modifies the defect configuration within the host matrix. The doping process leads to a reduction of the crystallite radius (from ∼ 20 to ∼8 nm) while increasing the residual strain (from ∼ 0.2 to ∼ 1.1 %). UV-Vis spectroscopy, modeled using Elliott's approach, reveals defect dynamics through variations in band gap and Urbach energy, with these parameters reaching extrema at low doping levels (up to x = 0.02). The broadening parameter supports formation of the Znᵢ, reflecting increased lattice disorder and pronounced electronic effects. Raman spectroscopy revealed charge carrier concentration (n) linked to the Al-content, with longitudinal optical phonon–plasmon coupled mode yielding an evolution of n given a maximum value of ∼10²² cm⁻³ at x = 0.015 of Al-content. Electron paramagnetic resonance of undoped ZnO showed prominent signals at g₁ = 1.9000 and g₂ = 2.0024, attributed to singly ionized interstitial zinc (Znᵢ) and singly ionized zinc vacancies (VZn), respectively. These signals reflect a high density of paramagnetic defects, consistent with the small crystallite size and high surface-to-volume ratio. Upon Al incorporation, the g₂ signal intensity decreases, indicating passivation or annihilation of VZn centers. In contrast, the g₁ signal intensity shows a transient increase at x = 0.005, suggesting an initial rise in Znᵢ concentration before its suppression at higher doping levels. Impedance spectroscopy demonstrated decreasing resistivity with rising Al-content, particularly from x = 0.005–0.020, corresponding to higher carrier concentrations. This trend aligns well with the carrier density evolution inferred from Raman spectroscopy via longitudinal optical phonon–plasmon coupled.
dc.description.sponsorshipFunding: The authors acknowledge partial support from the following Brazilian agencies: the National Council for Scientific and Technological Development ( CNPq ) and the Coordination for the Improvement of Higher Education Personnel ( CAPES ). F.F.H.A. also acknowledges support from the Peruvian agency ProCiencia through project PE501087009–2024 , and the Air Force Office of Scientific Research ( AFOSR ) Grant No. FA9550–25–1–0006 .
dc.identifier.doihttps://doi.org/10.1016/j.jallcom.2025.183020
dc.identifier.urihttp://hdl.handle.net/20.500.14657/205796
dc.language.isoeng
dc.publisherElsevier
dc.relation.ispartofurn:issn:0925-8388
dc.rightsinfo:eu-repo/semantics/closedAccess
dc.sourceJournal of Alloys and Compounds; Vol. 1039 (2025)
dc.subjectRaman spectroscopy
dc.subjectPlasmon-phonon coupling (PPC)
dc.subject.ocdehttps://purl.org/pe-repo/ocde/ford#1.03.01
dc.titleDefect dynamics evolution in Zn1-xAlxO nanocrystals: Interplay of structural, optical, and electrical properties
dc.typehttp://purl.org/coar/resource_type/c_6501
dc.type.otherArtículo
dc.type.versionhttps://vocabularies.coar-repositories.org/version_types/c_970fb48d4fbd8a85/

Files

Collections